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SEM/EDS and FTIR Services

SEM or scanning electron microscopy allows high magnification analysis and high depth of field analysis of bulk samples.  Since the electron beam is an ionizing source of radiation several signals are emitted, including x-rays that can be collected to form a spectrum.  This x-ray spectrum can be used to identify the elements present.
IR or infrared analysis typically results in a spectrum that can be used as a finger print to compare an unknown material to a data base of known materials. The peaks present are due to the type and amount of covalent bonds, therefore the spectra also can be interpreted “AS IS” revealing the general type of material without comparison to a library. Typically organic compounds give rich detailed spectra and inorganic compounds give weak or no spectra.